Afm probes: 6 предложений в России

Our standard AFM probes offer a wide range of scanning modes, resonant frequencies, force constants, and coating options suitable for all your AFM research needs. ...

TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Contact Mode, Al reflective coating, resonant frequency 8-25 kHz, force constant ...

We would like to present you our new products - Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their ...

The substrate for the samples of mica Mica is a natural material, widely used in atomic force microscopy as a substrate. When chipping on the surface of mica ...

SNOM — scanning near-field optical microscope, scanning near-field optical microscopy. In near-field optical microscopy uses different principles of construction ...

Company TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It's a type of pure, highly laminar graphite used as an atomic-scale calibration standard ...