Scanning probe microscope: 3 предложения в России

... for all your AFM research needs. The cantilever is a key element of any scanning probe microscope, the properties and quality of which depends on the successful operation of the ...

... and electrical force microscopy lateral and adhesion force microscopy scanning capacitance and Kelvin probe spreading resistance LAO lithography and other special modes ...

... that the probe (detector) of the near-field microscope provided with a device for the spatial scan, the scanning device called optical near-field microscope. This microscope allows ...