Afm cantilever: 6 предложений в России

... frequencies, force constants, and coating options suitable for all your AFM research needs. The cantilever is a key element of any scanning probe microscope, the properties ...

SNOM — scanning near-field optical microscope, scanning near-field optical microscopy. In near-field optical microscopy uses different principles of construction of the image of ...

... 0.06-1 N/m. and TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Semicontact/Noncontact mode, uncoated, resonant frequency 200-400 ...

... of Diamond - at least 10x Lifetime of Silicon. Standard AFM chip size. Sharp, single crystal diamond AFM probes give the AFM user all the known resilience benefits of hard ...

The substrate for the samples of mica Mica is a natural material, widely used in atomic force microscopy as a substrate. When chipping on the surface of mica are formed by ...

Company TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It's a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force ...